Abstract
The technologically important Cd1−xNixSe thin films with variable compositions (0 ≤ x ≤ 1) have been developed by a chemical deposition method. The structural, compositional, optical and electrical properties were studied by X-ray diffraction, Scanning electron microscopy, Atomic absorption spectroscopy, UV–visible double beam spectrophotometer and d.c. two probe method. XRD studies indicate polycrystalline in nature with hexagonal phase for all the samples. The lattice constants decrease with increase in nickel content in CdSe host lattice. The surface morphology study of all samples reveals uniform and spherical grains. An optical study of the samples shows that band gap value decreases with nickel content. Electrical measurements depict semiconducting properties of all samples.
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