Investigation of Structural and Dielectric Properties of Polycrystalline PbMg1∕3 Ti1∕3W1∕3O3 Tungsten Perovskite

Abstract

Lead magnesium tungsten titanate PbMg[Formula: see text] Ti[Formula: see text]W[Formula: see text]O3 was prepared by adopting a high-temperature solid-state reaction method. The sample has tetragonal crystal structure having average crystallite size 45.1325[Formula: see text]nm calculated using Scherer’s relation and the average grain size is about 40[Formula: see text]nm from Scanning Electron Microscope (SEM) measurement. Measurements of dielectric permittivity ([Formula: see text]) and loss ([Formula: see text]) have been investigated, both as a function of frequency (1[Formula: see text]kHz to 5[Formula: see text]MHz) and temperature (25–[Formula: see text]C) and the results showed the presence of interfacial polarization of the material. The dielectric spectra with frequency and temperature suggest that the prepared sample is semiconducting in nature following the NTCR behavior. The complex impedance results showed the contribution of grain and grain boundaries in the conduction mechanism. The activation energies were determined from the ac conductivity data in the temperature ranges of 200–[Formula: see text]C and 360–[Formula: see text]C. It has been observed that with the rise of frequency and temperature, the activation energy increases in the sample. The greater value of the activation energy always supports the conduction mechanism due to hopping of the charge carriers. The semicircular arcs of Cole–Cole plots confirm that the sample is semiconducting in nature which supports our dielectric results.