Investigation of snow cover solid phase using total‐reflection x‐ray fluorescence method for an assessment of the environmental pollution

Abstract

AbstractSnow cover is an important source of data for the study of environmental pollution due to its ability to accumulate atmospheric dust particles. A total reflection x‐ray fluorescence method (TXRF) was applied to assess the concentration levels of potentially toxic elements (As, Pb, Zn, Ni, Cu, Cr, V, Mn, and Sr) in samples of snow cover solid phase collected in suburban areas of the Irkutsk region with industrial activity. Suspension was chosen as an optimal sample preparation procedure for solid phases of snow samples obtained after melting and filtration. Results were compared with those obtained by wavelength‐dispersive x‐ray fluorescence spectrometry and atomic absorption spectrometry. Precision of TXRF results expressed by repeatability values was not exceeded 15% (n = 3) for most of the elements, and the trueness of the TXRF method expressed by recovery values was in the range of 87%–115% for concentration levels of 5.0–350 μg/g. Forty samples of snow cover solid phase were analyzed by TXRF method and results were compared with the background values. The investigation showed low contamination of the studied area by Pb, Cu, V, Mn, and Sr, medium contamination by Ni, As, and Cr, and high contamination by Zn. TXRF is advantageous in being rapid, cost‐efficient, and simple and can be used as a promising method for an assessment of environmental pollution.