Abstract

Devices based on surface plasmon resonance (SPR) are used to determine the refraction index (RI) of liquids and gases. In these cases, as a sensitive element (SE), they use precious materials. It is also known that RI of an investigated substance (analyte) depends on temperature, which brings in some errors into results of measurements. The existing construction solutions for controlling and adjusting the analyte temperature possess a number of deficiencies, namely: high inertness and consumption power. The aim of this work was to study the possibility of using ITO films (In2O3-SnO) as SE and thin-film heaters in SPR devices to enhance their accuracy. For the first time, excitation of SPR by using the wavelength 650 nm in ITO films has been proved experimentally. It has been also shown that using the heaters based on ITO films reduces the error of measuring the analyte RI by 1.8 times and the consumed power – by 2.3 times as compared with the existing heaters of the resistive type that are used now in SPR devices.

Highlights

  • The leading tendencies in development of analytic devices require implementation of new physical methods for measurements that are based on up-to-date achievements in science and technique

  • One of the promising optical methods for analysis of various compounds and micro-objects as well as processes at the molecular level is the refractometric method based on surface plasmon resonance (SPR) phenomenon

  • The results of our experiments have shown that SPR is excited in ITO films at the wavelength of exciting radiation 650 nm, which is confirmed by the characteristic minimum in the reflection curve for the angles higher than the total internal reflection (TIR) angle at the boundary film - air (55.175 degree, Fig. 2)

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Summary

Introduction

The leading tendencies in development of analytic devices require implementation of new physical methods for measurements that are based on up-to-date achievements in science and technique. It results in increasing dimensions and power consumed by SPR-devices as well as time for transfer heat from a heater.

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