Investigation of reversible plasticity in a micron-sized, single crystalline copper bending beam by X-ray μLaue diffraction

Abstract

The observed mechanical behaviour of micron-sized samples raises fundamental questions about the influence of size on the underlying dislocation plasticity. In situ µLaue diffraction on a single crystalline copper bending beam was performed to study the feasibility of bending tests and their contribution to our understanding of size-dependent dislocation plasticity. Theoretical considerations lead to a minimum sample size where in situ µLaue experiments are useable. A critical size is evidenced below which, depending on Young's modulus and maximum stress, the elastic and plastic contributions to the lattice curvature cannot be separated. The experiment shows the increase in geometrically necessary dislocations during plastic deformation followed by a decrease during unloading. This can be explained by the formation and dissolution of a dislocation pile-up at the neutral axis of the bending cantilever. The dissolution of the dislocation pile-up is caused by the back stress of the pile-up and a direct observation of the Bauschinger effect, which is consistent with the non-purely elastic mechanical behaviour when unloading the sample.