Abstract
The objective of this study was to comprehensively investigate and compare PCBM/ZnO and C60/BCP-based electron transport layers (ETLs) (well recognized as representative ETLs) between perovskite and metal electrode in perovskite solar cells (PeSCs) for high-performance p-i-n structure PeSCs. Their film characteristics and their effects on solar cell performances were studied. When PCBM/ZnO was used as ETL material, the PCE of PeSCs was 19.36 %, which was higher than the PCE of 17.10 % when C60/BCP was used possibly due to more efficient charge recombination reduction and charge extraction shown in PCBM/ZnO-based devices. However, in terms of stability (air, light-soaking, and heat), C60/BCP-based devices showed higher stability than PCBM/ZnO-based devices.
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