Abstract
Magnetoresistance (MR) measurements are used to investigate the topological nature of nanobulk assembly of two dimensional (2D) Bi2Te3 nanoflakes prepared by microwave assisted solvothermal reactions. Average edge to edge length of individual hexagonal nanoflakes is found to be of ∼3-4 microns as demonstrated by SEM micrographs. Nanobulk assemblies prepared out of this 2D nanoflakes exhibit rhombohedral structure and have a high surface to volume ratio that is advantageous for probing the signatures of surface states through bulk measurements. At low temperatures, magnetic field dependent MR measurements demonstrate a clear positive MR with a prominent dip below ±1T. Significant changes happening in magnetic field dependent MR measurements are analyzed and discussed in the light of Weak anti localization (WAL) effect arising likely from surface states in nanobulk Bi2Te3 materials which on proper optimization can open up a new gateway for large scale application of these topological insulating materials in NEMS and MEMS technology.
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