Abstract
The paper presents the results of low-temperature nitriding in non-self-maintained high-current arc discharge and in glow discharge. Measurement results of microhardness across the depth of a nitrated layer are given. It is found that the depth of a nitrated layer depends on treatment temperature. The temperature increase from 450 to 600 °C during nitriding in non-self-maintained high-current arc discharge leads to the increase in the depth of a nitrated layer from 10 to 24 μm, and from 10 to 22 μm when treated in a glow discharge. The paper also describes data on residual stress in a surface layer of samples after low-temperature ion nitriding.
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