Abstract
A Photon Scanning Tunneling Microscope (PSTM) with probe-sample distance control by electron tunneling is used to probe the localized surface-plasmon fields of individual nanometric silver particles. As samples, conventional island films produced by thermal evaporation and regular particle arrays produced by an electron-beam-lithography-based technique, respectively, are used. In either case the strength and spatial localization of the surface-plasmon fields strongly depend on the excitation wavelength. The results are interpreted as different resonance frequencies of individual particles or of different sample areas. On regular arrays consisting of particles with a smallest diameter of 40 nm, the PSTM maps represent the plasmon field strength spatially resolved for individual particles.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Applied Physics A Materials Science & Processing
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
