Abstract

We report the local and nonlocal nonlinear optical refraction properties of indium doped zinc oxide (IZO) thin films using closed aperture Z-scan technique. The Z-scan results show the films have positive nonlinear optical refraction properties. The nonlocal parameter m of samples is increased with indium. In both of local and nonlocal studies, the nonlinear optical refractions of thin films were increased with In contents and laser energy. This relation reveals the role of In composition in IZO affects on the nonlinear optical responses of the films. These results make the IZO thin films as the promising application in optoelectronics devices.

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