Abstract
Abstract : The double clamshell arc imaging system has been successfully applied in a practical arrangement for physical property measurements. Thermal ex pansion measurements of alumina and zircon have been made to 1950 K (1670 C). An inflection in slope of the thermal expansion of zircon was observed at 1570 K indicating a possible phase transition previously unreported. Simple modifications (coating of mirrors) will provide higher temperatures (calculated at 2260 K). Electrical property measurements can be made in the fieldfree environment. (Author)
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