Abstract
In this paper we propose a resonant structure based on complementary metamaterial that can be used to control and monitor parameters of a material under test. We used CST Studio Suite to create a computer model of the proposed device and simulate it performance. The performance of the sensor is characterized by its scattering parameters that can be calculated by simulation. The results obtained are then analyzed and used to derive the relation between the sensor’s resonant frequency and the characteristics of the analyte. The proposed resonant structure and method can be used for nondestructive evaluation of dielectric substances, defect control, monitoring and measurement applications.
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