Abstract
Various two-dimensional (2D) materials have emerged as exciting platforms for investigation of novel physical phenomena and next-generation electronic applications. In this article, the history and recent research results on 2D materials with transmission electron microscopy (TEM) are reviewed. In particular, the utilization of high-resolution TEM and scanning TEM (STEM) imaging for direct visualization of structural inhomogeneities in 2D materials is discussed. The out-of-plane rippling, local bonding rotations, vacancy defects, stacking configurations, and edge reconstruction in various 2D crystals are exemplified. TEM-based structural analysis will continue to serve as the core analytical tool for designing the synthesis rules and understanding of materials’ properties for 2D materials.
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