Abstract
Knowledge about space-charge layers and transport parameters in thin films is necessary for an understanding of the electrical properties of semiconductor heterostructures and metal-semiconductor junctions. The application of high-resolution electron energy-loss spectroscopy (HREELS) for the investigation of such problems is briefly discussed. As an example for the study of a space-charge layer the coupled surface plasmon/phonon polaritons measured in HREELS yield information about carrier density and band bending in the depletion layer generated by oxygen adsorption on InSb(110). HREELS studies of Sn films deposited on InSb(110) illustrate how information about transport parameters of the overlayers can be obtained. Some other results about thin metal films on semiconductor surfaces are also presented.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
