Abstract
Thin films of 4-tricyanovinyl- N, N-diethylaniline (TCVA) with different thickness were prepared using thermal evaporation technique. A relative permittivity, ɛ r, of 3.04 was estimated from the dependence of capacitance on film thickness. The current density–voltage ( J– V) characteristics of TCVA thin films have been investigated at different temperatures. At low-voltage region, the current conduction in the Au/TCVA/Au sandwich structures obeys Ohm's law. At the higher-voltage regions, the charge transport phenomenon appears to be space-charge-limited current (SCLC) dominated by an exponential distribution of traps with total trap concentration of 1.21 × 10 22 m −3. In addition, various electrical parameters were determined.
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