Abstract
A method of investigation of crystal imperfections on the basis of multiple X-Ray interferometers is proposed and tested. Double and triple X-Ray interferometers enable a more complete description of the deformed state of crystals, revealing different interference patterns (segregation lines, fringe shifts, Moire patterns), and analysis of the formation of their contrast caused by defects in the crystals under investigation. Double and triple three- and four-crystal interferometers are tested; Moire patterns are obtained. A perfect method of stereometric topography is proposed for detecting defects in single crystals.
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Schedule a callMore From: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
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