Abstract
Multilayer structures of MZrO 3 (M=Ba, Sr) and Y 0.9Ba 1.9La 0.2Cu 3O y (La–YBCO) were investigated with the aim of fabricating reliable ramp-edge Josephson junctions on a superconducting ground plane. It was found that the quality of the multilayer structures of MZrO 3 and La–YBCO depends on the composition of MZrO 3 thin films. When Ba/Zr=1, both BaZrO 3/La–YBCO and La–YBCO/BaZrO 3 bilayer films exhibited clear interfaces and smooth surfaces. However, when BaZrO 3 films contained excess Ba, BaZrO 3 thin films prepared on La–YBCO showed rough surfaces and poor adhesion. For SrZrO 3 thin films, we obtained experimental results suggesting a strong correlation between Sr/Zr composition in the films and the quality of La–YBCO on the SrZrO 3 films.
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