Abstract
This paper reports 2.0 μm emission properties of Tm 3+/Ho 3+ co-doped oxyfluoride tellurite glass exited by 808 nm laser diode (LD). Mid-infrared transmittance property of glass was investigated by Fourier transform infrared (FTIR) spectrometer. The real chemical composition of investigated glass was identified by X-ray photoelectric spectroscopy (XPS). Thermal stability of the glass was determined by differential thermal analysis (DTA) measurement. The Judd–Ofelt parameters, spontaneous radiative transition probabilities, branching ratios and radiative lifetime of Ho 3+ were calculated based on the absorption spectra by using Judd–Ofelt theory. Results indicate that the maximum 2.0 μm emission intensity attributed to the 5I 7→ 5I 8 transition of Ho 3+ was achieved at 1.5 mol% Tm 2O 3 and 1 mol% Ho 2O 3 concentrations in oxyfluoride tellurite glass. OH − absorption at 3000 cm −1 was greatly depressed by introduction of 10 mol% F −. The maximum absorption and stimulated emission cross-section of Ho 3+ near 2.0 μm are 7.0×10 −21 cm 2 at 1950 nm and 8.8×10 −21 cm 2 at 2048 nm, respectively. The calculated radiative lifetime of 4.4 ms for 5I 7→ 5I 8 transition and large stimulated emission cross-section of the Tm 3+/Ho 3+ co-doped oxyfluoride tellurite glass indicate that the glass has a potential application in efficient 2.0 μm laser.
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