Investigating the Molecular Orientation and Thermal Stability of Spiro-OMeTAD and Its Dopants By Near Edge X-Ray Absorption Fine Structure

Abstract

This work describes the utilization of near edge X-ray absorption fine structure (NEXAFS) to investigate the hole transporting material (HTM) 2,2ʹ,7,7ʹ-tetrakis(N,N-di-p-methoxyphenylamine)- 9,9ʹ-spirobifluorene (Spiro-OMeTAD) and its most common dopants, lithium bis-(trifluoromethylsulfonyl) imide (LiTFSI), 4-tert-butylpiridine (tBP) and 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F4-TCNQ). Utilizing angle resolved NEXAFS, the orientation of the molecules on the surface can be observed. The data suggests it is difficult to determine any orientational preference for Spiro-OMeTAD deposited on a surface due to the 3D propeller-like geometry of this molecule. Both doped and undoped samples show thermal stability beyond the glass transition temperature of the molecules. Significant changes to the Spiro-OMeTAD spectra were observed with the addition of the dopants, in particular the C K-edge. Differences are also observed in the valence band spectra when dopants are added. It is also demonstrated how the doping combination of LiFTSI with tBP and, F4-TCNQ act as p-type dopants by altering the position of the HOMO levels. The F4-TCNQ induces a larger change in the HOMO levels when compared to the LiTFSI and tBP. These results are important to increase our understanding of Spiro-OMeTAD and the effect dopants have on this material for next generation solar cells.