Investigating Surfaces by Complimentary Chemical Spectroscopies

Abstract

Use of complimentary analytical techniques has been the standard for surface and interface analysis for some time. The availability of techniques that can collect data from nanoscale films, as well as user facilities which provide access to synchrotron and other advanced spectroscopic techniques which are beyond the developmental capabilities of individual users, have over the past few decades enabled clarification of surface chemistry and mechanisms in corrosion, coatings, energy and environmental interactions. Combined with synthesis and modeling, characterization methods such as XPS, EXAFS, SIMS, vibrational spectroscopies and chemical mapping have allowed the design of incredibly useful experiments to explore surface and interfacial phenomena which govern the properties and performance of modern engineering materials. This review illustrates the value of such methods through key examples from coatings, corrosion, contamination and environmental remediation, and discusses how the methodology of combining complimentary chemical spectroscopies, advanced imaging and synthesis are informing the design of next-generation, high performance materials and structures. We also discuss the important contribution of complimentary spectroscopies for chemical analysis to materials engineering education.