Abstract
In this study, <em>Barlase</em>, a semiconductor laser diode emulation tool, is used to emulate the by-emitter degradation of high power semiconductor laser diodes. <em>Barlase</em> is a software that uses a LabView control interface. We have demonstrated how Barlase works using a hypothetical laser diode bar (multiple emitters) to validate the usefulness of the tool. A scenario using the hypothetical bar was investigated to demonstrate <em>Barlase</em> as follows: random low-level of defects distributed across the bar. The results of the simulation show the successful implementation of <em>Barlase</em> in the by-emitter analysis of laser diodes.
Highlights
Progress in the development of high-power laser bars is due to their high demand and their improved reliability and durability
The threshold current increases and the slope efficiency decreases for emitters with a higher trap density
The scenario investigated using multi-emitter simulations show that variations in the operating conditions and environment of the individual emitters affect the performance of the other emitters and of the bar as a whole
Summary
Progress in the development of high-power laser bars is due to their high demand and their improved reliability and durability. This has warranted the widespread usage (Steele, 2008) of such devices in recent times. The simulation tool, Speclase, which is a 2.5 D spectral laser model, the full details of which have been published elsewhere Lim et al (2009) and Lim et al (2007), gave rise to Barlase (Amuzuvi and Attachie, 2013). This study will discuss how a LabView control interface is used to communicate between Speclase and Barlase for by-emitter analysis of a laser bar. This study describes and explores the use of Barlase to simulate lasers at the multi-emitter level of operation
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