Abstract
Neutron radiation on advanced integrated circuits (ICs) is becoming important for their reliable operation. However, a neutron test on ICs is expensive and time-consuming. In this work, we employ Monte Carlo simulation to examine if a proton test can replace or even accelerate the neutron test, and we found that 200 MeV protons are the closest to resembling neutron radiation with five main differences. This 200 MeV concur with the suggestion from National Aeronautics and Space Administration (NASA, Washington, DC, USA). However, the impacts of the five differences on single event effects (SEEs) require future work for examination.
Highlights
Technological developments bring smaller and faster devices in integrated circuits that operate at reduced bias voltages
Than the range.efficiency, Monte Carlo achieveis asetcharged-particle equilibrium andsecondary maintainparticle simulation the simulation may have boundary crossing problems when particles transport from a large volume to a diameter of the structure is set to 1 mm, which is much larger than the secondary particle range
From the Monte Carlo studies in this work, in comparing the linear energy transfer (LET) spectra and secondary particles yield from the proton and neutron radiation, we found that 200 MeV proton radiation has the closest resemblance to the neutron radiation, which concurs with suggestions from NASA
Summary
Technological developments bring smaller and faster devices in integrated circuits that operate at reduced bias voltages. They suffer from increased susceptibility to neutrons. These neutrons can cause single event effects (SEEs) on the integrated circuits, rendering their temporary loss of function Such temporary loss of function may be a critical issue in many applications, especially for implanted medical electronics such as pacemakers [1]. Sci. 2020, 10, 3234 circuit-level, and semiconductor processes where several companies are reporting their radiation tests in the workshop. In a radiation hardness test, the dose can be controllable by flux, but the LET is the characteristic of particles with specific energy. The energy spread is less than 10% for low energy (30 MeV) and 1% for higher energy (110 + MeV)
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