Investigate and Reduce Capacitive Couplings in a Flyback Adapter With a DC-Bus Filter to Reduce EMI

Abstract

In consumer electronics, high power density power adapters are designed to minimize the adapter size. As a result, the components are getting very close and the near-field coupling issue tends to be severe. This compromises the performance of electromagnetic interference filters, especially at high frequencies. This article investigates near-field capacitive couplings and the reduction techniques in a high power-density power adapter with a dc-bus filter. The parasitic capacitive coupling theory is developed and parasitic coupling capacitances are experimentally extracted. The common-mode (CM) noise model with parasitic capacitive couplings is developed and the techniques to reduce the CM noise due to parasitic capacitive couplings are explored. Simulation and experiments were conducted to verify the analysis and the proposed techniques.