Abstract
AbstractComparators are very important circuits that can be found in a variety of applications, especially comparators whose reference level can be controlled. In this paper, a voltage‐controlled comparator whose reference voltage is controlled by a control voltage and a programmable comparator whose reference voltage is controlled by an input bit pattern are presented. These two comparators are analyzed quantitatively. The performance of the two proposed comparators is verified by simulation using the Berkeley predictive‐technology models (BPTM) of the 45‐, 32‐, 22‐, and 16‐nm complementary metal‐oxide semiconductor (CMOS) technologies with power‐supply voltages, VDD, of 1, 0.9, 0.8, and 0.7 V, respectively. The proposed controlled comparator is compared with the conventional latch‐type comparator from the points of view of the response time, the output amplitude, and the power consumption.
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