Abstract
Silica microresonators with an inverted-wedge shape were fabricated using conventional semiconductor fabrication methods. The measured quality factors of the resonators were greater than 10(6) in 1550 nm band. Controllable coupling from undercoupling to the overcoupling regime through the critical coupling point was demonstrated by horizontally moving a fiber taper while in touch with the top surface of the resonator. The thin outer ring of the resonator provided a support for the fiber taper leading to robust stable coupling.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
