Abstract
The dielectric constant of an isotropic homogeneous layer on an isotropic substrate is shown to satisfy a quintic equation, with the coefficients determined by |ρ|(2) and Re(ρ), where ρ = r(p)/r(s) is found ellipsometrically. This algebraic equation eliminates many (but not all) of the nonphysical roots in the inversion of ellipsometric data. A simple form is obtained if the angle of incidence is equal to the Brewster angle of the substrate. The problem of inversion for thin films is also discussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
