Abstract
The Marchenko inversion method is employed to determine the scattering-length density profile from the reflectivity for a number of realistic cases. Phase information is obtained via a logarithmic dispersion relation connecting the reflection phase with the reflectivity. The remaining ambiguities to be resolved by phase measurements are analyzed. Their importance for a unique determination of the profile is illustrated. \textcopyright{} 1996 The American Physical Society.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
