Abstract

The inverse two flux (SS, SP and CC) approximations are presented for determining single scattering albedo and asymmetry factor from the hemispherical transmittance and reflectance data for an anisotropically scattering slab of finite thickness subjected to isotropic incident radiation at one of its boundary surfaces. Analytical expressions of the reflectance and transmittance are derived with the two flux methods and applied to determine the parameters with the use of an IMSL subroutine for solving the nonlinear constrained least mean square equation formulated. The results of inversed parameters are compared to those obtained by the P1 method. The accuracy of the predictions of both two-flux and P1 methods are also discussed.

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