Abstract
We consider the two-dimensional TE and TM diffraction problems fora time harmonic plane wave incident on a periodic grating structure.An inverse diffraction problem is to determine the grating profile frommeasured reflected and transmitted waves away from the structure. Wepresent a new approach to this problem, which is based on the materialderivative with respect to the variation of the dielectric coefficient. This leadsto local stability estimates in the case of interfaces with corner points.
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