Abstract

In RUS, the fit between the experimental resonant spectrum and the result of the inversion procedure is usually worse than the inaccuracy of the experimental measurement of the resonant frequencies. Thus, it can be problematic to extract any valuable information from slight perturbation of experimental spectra, where the experimental frequency shift falls well below the accuracy of this fit. However, the inverse procedure can be reformulated and instead of fitting the resonant frequencies itself, it can be based on the direct fitting of the frequency perturbations. In this contribution, we show two examples of the use of this approach (i) quantitative RUS evaluation of the elasticity of micrometric and submicrometric surface layers from frequency differences measured before and after layer deposition [1] and (ii) in situ characterization of the thermal degradation of the bonding layer in a bimetallic system [2]. [1] Thomasová M. et al. Young's moduli of sputter-deposited NiTi films determined by resonant ultrasound spectroscopy: Austenite, R-phase, and martensite (2015) Scripta Materialia, 101, pp. 24–27. [2] Janovská M. et al Characterization of bonding quality of a cold-sprayed deposit by laser resonant ultrasound spectroscopy (2020) Ultrasonics, 106, art. no. 106140.

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