Inverse photoemission and Auger electron spectroscopy of Rh thin films on Cu(100)

Abstract

The growth of Rh films on Cu(100) has been investigated using Auger electron spectroscopy and momentum- (k-) resolved inverse photoemission (KRIPES) with a view to probing the electronic structure of near-monolayer films and any possible magnetic ordering within these films. A pronounced change in the line-shape of the Rh M4,5VV Auger electron peak as a function of average layer thickness indicates significant d-band narrowing in the films of monolayer or submonolayer thickness relative to thicker films. KRIPES data indicate that in films grown at room temperature the spectra are dominated by density-of-states effects implying poor order, and showing the expected unoccupied d-band feature at the Fermi level. Annealing at 750-900 K leads to significant loss of Rh into the substrate, and KRIPES spectra dominated by surface-localized states showing significant dispersion in parallel momentum more characteristic of s-p-band features.