Introduction

Abstract

The following papers are those arising from the 14th Conference and Workshop on Electron Backscatter Diffraction (EBSD): its applications and related techniques, which was held between the 26th and 28th of March 2007 in New Lanark, Scotland. EBSD has played and continues to play a significant role in texture analysis, in the development of grain boundary engineering, in the understanding of phase transformations and in determining strain and defect distributions in materials on the micro- and nano-scale. The 2007 EBSD conference and this issue of the Journal of Microscopy reflect the recognition of EBSD as the technique of choice for the analysis and optimisation of the microstructure and nanostructure of a wide range of materials and also convey the excitement of new developments aimed at obtaining more and new information from this versatile technique. The 2007 EBSD meeting enabled scientists and engineers from different backgrounds (physics, earth science, material science) to meet and discuss their latest results. Recrystallisation, deformation, phase transformations, strain and dislocations were all topics of discussion as were new developments in the analysis and simulation of EBSD patterns. Recent results from 3D EBSD, where successive EBSD maps are acquired following sectioning using a focussed ion beam, were hotly debated. The annual EBSD conference, ably organised by the Royal Microscopical Society, continues to grow in popularity; around 100 scientists, engineers, equipment and software manufacturers came to New Lanark—delegates from Scotland, England, Wales, USA, Germany, The Netherlands, France, Sweden, Denmark, Austria, Switzerland, Japan, South Korea and India attended the conference. The conference was extended from its usual 2-day format by an additional day to celebrate Prof. David Dingley's pioneering contributions to the development and application of EBSD and related techniques. As well as a wide range of talks covering all areas of EBSD presented by current and former colleagues of David from across the globe, conference participants were entertained with anecdotes and videos recalling the early days of EBSD. For example the first EBSD patterns were recorded on photographic film, each pattern taking at least an hour to acquire compared to the 0.01 s of today. Over the 3 days of the conference, a total of 38 oral presentations—including four keynote lectures and nine ‘David Dingley Day’ invited talks—and 27 poster presentations were given. In addition to the formal programme, there was much animated and fruitful discussion both in the New Lanark Mill Hotel, but also on walks in the beautiful gorge at New Lanark. The whisky tasting proved an interesting preamble to the evening discussion session. This issue of the Journal of Microscopy provides a microcosm of the spirit engendered at New Lanark.