Abstract
2008 marked the 40th anniversary of the seminal paper “Solid-State Energy-Dispersion Spectrometer for Electron-Microprobe X-ray Analysis” by Ray Fitzgerald, Klaus Kiel, and Kurt Heinrich [Science (1968), 159, 528] that introduced the Si(Li) energy dispersive spectrometer (EDS) detector as a practical analytical tool to the electron microscope community. In recognition of that anniversary, the Microscopy Society of America and the Microbeam Analysis Society organized a symposium at the 2008 Microscopy and Microanalysis Conference in Albuquerque, New Mexico to review the remarkable progress in Si(Li) EDS that has made elemental analysis available on virtually any electron beam platform.
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