Abstract
We propose a novel approach, "faFJP", to the computer controlled polishing (CCP) of mini aspheres down to 0:2 mm. The generation of locallytunable, full-aperture footprints is accomplished by applying a Fluid Jet Polishing (FJP) beam larger than the full aperture being polished and varying the incident angle.
Highlights
Thanks to their point symmetry, spherical lenses have been produced for centuries in high qualities and quantities, with shape deviations down to dozens of nanometres, by applying chaotic, semi-random tool paths above the rotating workpiece
We propose an alternative approach, named "faFJP", to the computer controlled polishing (CCP) of mini aspheres featuring clear-apertures down to 0.2 mm
Instead of traversing a static, sub-aperture footprint across the clear-aperture, faFJP uses a locally-tunable, full-aperture footprint by applying a macroscopic Fluid Jet Polishing (FJP) beam, which has a diameter larger than the clear aperture being polished
Summary
Thanks to their point symmetry, spherical lenses have been produced for centuries in high qualities and quantities, with shape deviations down to dozens of nanometres, by applying chaotic, semi-random tool paths above the rotating workpiece. The fact that aspherical lenses possess line symmetry, rather than point symmetries, forced optical fabrication engineers to invent numerous dedicated polishing techniques, each featuring the generation and application of sub-aperture footprints (local polishing spots within the clear aperture of the optical surface) such as belts [1], bonnets [2], fluid jets [3, 4], ion beams [5], plasma jets [6], magnetorheological fluids [7], rotating spheres [8] or polyurethane needles All these techniques distinguish themselves in the type of aspherical shapes producible, quality generable or dimensions manageable. The variation of the footprints is generated by changing the incident angle of the fluid beam with respect to the asphere axis of symmetry, due to FJP’s characteristic wear profile
Sign-in/Register to view highlights & summary Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
