Abstract

The work is aimed to study the nature of intrinsic luminescence in Lu2SiO5 (LSO) and Y2SiO5 (YSO) orthosilicates based on the results of luminescence spectroscopy under excitation by pulsed synchrotron radiation with the energy in the fundamental absorption range of their hosts. We confirm in this work that the intrinsic emission bands of LSO and YSO crystals, peaked correspondingly at 260 and 325nm and 340 and 385nm, can be caused by the luminescence of self-trapped excitons (STE) from the singlet and triplet radiative levels, respectively.

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