Interval Arithmetic and Self-Similarity Based RTL Input Vector Control for Datapath Leakage Minimization

Abstract

With technology scaling, subthreshold leakage has dominated the overall power consumption in a design. Input vector control is an effective technique to minimize subthreshold leakage. Low leakage input vector determination is not often possible due to large design space and simulation time. Similarly, applying an appropriate minimum leakage vector (MLV) to each Register Transfer Level (RTL) module instance in a design often results in a low leakage state with significant area overhead. In this work, we propose a top-down and bottom-up approach for propagating the input vector interval to identify low leakage input vector at primary inputs of an RTL datapath. For each module, via Monte Carlo simulation, we identify a set of MLV intervals such that maximum leakage is within (say) 10% of the lowest leakage points. As the module bit width increases, exhaustive simulation to find the low leakage vector is not feasible. Further, we need to uniformly search the entire input space to obtain as many low leakage intervals as possible. Based on empirical observations, we observe self-similarity in the subthreshold leakage distribution of adder/multiplier modules with highly regular bit-slice architectures when input space is partitioned into smaller cells. This property enables the uniform search of low leakage vectors in the entire input space where the time taken for characterization increases linearly with the module size. We further process the reduced interval set with simulated annealing to arrive at the best low-leakage vector at the primary inputs. We also propose to reduce area overhead (in some cases to 0%) by choosing Primary Input (PI) MLVs such that resultant inputs to internal nodes are also MLVs. Compared to existing work, experimental results for DSP filters simulated in 16nm technology demonstrated leakage savings of 93.6% and 89.2% for top-down and bottom-up approaches with no area overhead.