Abstract

We resonantly excite the n=2 excitons at 8 K in 13 nm and 17.5 nm GaAs quantum wells using 0.5 ps pulses from a Ti-Sapphire laser and perform four wave mixing (FWM) measurements. The exciton dephasing time is deduced by fitting the FWM spectra to a numerical solution of the optical Bloch equations for the excitonic resonance. The finite pulse width and presence of small inhomogeneous broadening are taken into account. The homogeneous linewidth thus obtained at different low excitation intensities has a linear dependence on the intensity. The zero intensity intercept is essentially governed by the n=2 exciton lifetime due to intersubband relaxation, the pure transverse dephasing contribution being relatively less important. We deduce the exciton lifetime to be 0.9 ps and 2.6 ps for the 13 nm and 17.5 nm QWs, respectively.© (2002) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

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