Abstract
AbstractTransmission electron microscopic (TEM) examination of the <0·1-µm fraction of montmorillonite and regularly interstratified illite-smectite (I-S) shows that these clays, when dried from suspension, consist primarily of particles 10 Å and 20 Å thick respectively. However, X-ray diffraction (XRD) examination of sedimented aggregates of montmorillonite indicate that the effective number of unit cells that are diffracting coherently is ∼9. This discrepancy can be reconciled by postulating an interparticle diffraction effect from the sedimented aggregates of oriented particles. The interfaces of these particles are capable of adsorbing water, ethylene glycol etc. so that on this basis smectite is composed of elementary silicate particles 10 Å thick, and regularly interstratified I-S is primarily composed of elementary ‘illite’ particles 20 Å thick, values which are in agreement with the TEM observations. This concept is confirmed experimentally by XRD examination of sedimented aggregates from mixed suspensions of both materials; the resulting patterns are identical to those of randomly interstratified illite and smectite layers, which indicates that the layer sequence examined by XRD has been entirely rearranged. It is concluded that the use of XRD peak breadth to determine mean crystal thickness cannot be reliably applied to these systems. Standard XRD data from sedimented aggregates may not be able to distinguish between true interstratification and interparticle diffraction effects of intimate physical mixtures.
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