Abstract
A study of the experimental behavior of the reversible ( M rev) and the irreversible ( M irr) DCD magnetization components in enhanced-remanence SmCo films was carried out. The evolution of the DCD M rev and M irr components were determined at room temperature by measuring sets of first-order reversal curves from different points on the initial magnetization curve and the demagnetization curve. From these data, M rev( M irr) H i curves were built, H i being the internal field of the sample. Recent studies show that the behavior of the M rev( M irr) curves at a constant internal field can be used as an indicator of the mechanism of reversal magnetization. The non-monotonic behavior showed by these curves at low fields in our material, seems to be associated with an incoherent mechanism of magnetization reversal in the nanograins of SmCo.
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