Abstract

Ideality factors are used to identify the dominant form of recombination in many types of solar cells and guide future development. Unusual noninteger and voltage-dependent ideality factors, which are difficult to explain using the classical diode theory, have been reported for perovskite solar cells and remain unexplained. Experimental measurements and theoretical simulations of the electric potential profile across a planar perovskite solar cell show that significant potential drops occur across each of the perovskite- and transport-layer interfaces. Such potential profiles are fundamentally distinct from the single potential drop that characterizes a $p$-$n$ or a $p$-$i$-$n$ junction. We propose an analytical model, developed specifically for perovskite devices, in which the ideality factor is replaced by a systematically derived analog, which we term the ectypal factor. In common with the classical theory, the ectypal diode equation is derived as an approximation to a drift-diffusion model for the motion of charges across a solar cell, however, crucially, it incorporates the effects of ion migration within the perovskite absorber layer. The theory provides a framework for analyzing the steady-state performance of a perovskite solar cell (PSC) according to the value of the ectypal factor. Predictions are verified against numerical simulations of a full set of drift-diffusion equations. An important conclusion is that our ability to evaluate PSC performance, using standard techniques such as the analysis of dark $J$-$V$ or Suns-${V}_{\mathrm{OC}}$ measurements, relies on understanding how the potential distribution varies with applied voltage. Implications of this work on the interpretation of data from the literature are discussed.

Highlights

  • The Shockley diode equation is commonly employed in solar-cell research to diagnose the recombination mechanism that limits the performance of a particular device architecture [1]

  • The ectypal diode theory tells us that the dominant recombination mechanism of a cell with nec = 1.6 is one that is controlled by an energy barrier that is more than half of the total potential drop across the cell

  • In response to reports of unusual and unexplained values of the classical diode ideality factor for metal halide perovskite solar cells, we propose an alternative analytic model that is tailored to the unique properties of a planar PSC

Read more

Summary

Introduction

The Shockley diode equation is commonly employed in solar-cell research to diagnose the recombination mechanism that limits the performance of a particular device architecture [1]. The diode model is derived from the theory of drift and diffusion of charge carriers across a solar cell, including the generation and recombination of charge carrier pairs (electrons and holes). Though approximate, this model provides a useful description of the currentvoltage (J -V) characteristics of many types of solar cell. The value of the diode ideality factor is key for the diagnosis of both the type of recombination that limits cell performance and its location within the device. The classical Shockley diode equation is derived from drift-diffusion theory and can be used to analyze the J -V characteristics of a solar cell with a p-n or p-i-n architecture [1].

Methods
Results
Discussion
Conclusion
Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.