Abstract
In this letter we address a technical peculiarity of wide-field magneto-optical Kerr microscopy, which may easily lead to a misinterpretation of the domain contrast on curved surfaces. On the example of circumferentially magnetized domains in ferromagnetic microwires we show that the checkerboard domain pattern, which typically shows up in polar Kerr sensitivity, is caused by the superposition of longitudinal Kerr contrasts that arise from in-plane magnetization components and inclined light incidence rather than from the magnetization components perpendicular to the focal plane as claimed in the literature. Experimental ways to avoid such peculiar contrasts are demonstrated.
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