Abstract
Abstract The magnetization depth profiles of Pt have been investigated by X-ray resonant magnetic reflectivity measurements of sputtered Pt/Co bilayer systems with different chemical roughness values at the Pt/Co interface. The asymmetry ratio as a function of the angle of incidence has been measured at the Pt L3 near-edge absorption region at the maximum of the X-ray magnetic circular dichroism effect. The observed asymmetry ratios in the order of 0.5% are described quantitatively on the basis of a magnetically modified optical approach. The curves of the extracted magnetization profiles in the Pt layer show a different behavior corresponding to chemical roughness, while the magnetic saturation moment of Pt at the Pt/Co interface remains unaltered.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
