Abstract
A novel internal-node waveform probing technique has been demonstrated on a C-band monolithic microwave integrated circuit (MMIC) power amplifier. The error of the measurement and its perturbance to circuit operation was estimated and verified to be within /spl plusmn/10%. Valuable insight was obtained from the variation of waveforms as a function of frequency, drive and location. The potential impact of this technique includes MMIC design verification, in-situ device model extraction, process diagnosis, and reliability assessment.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEE Transactions on Microwave Theory and Techniques
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
