Abstract
By using nonlinear resonant optical control and polarized photoluminescence, the authors studied the intensity dependence of exciton spin relaxation and photoluminescence polarization in single self-assembled InGaAs quantum dots. Data from dots with different dipole moments reveal two distinctive channels for polarization memory loss: (i) an external pathway due to carrier escape and capture to and from the wetting layer that is responsible for memory loss increasing with intensity and (ii) an internal loss channel due to intrinsic spin relaxation. The values obtained rule out a universal freezing of exciton spin relaxation in single self-assembled quantum dots related to the wetting layer.
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