Abstract
Effect of silicate sealing on tartaric sulphuric acid anodized 7010-T7451 and 7175-T6 alloys with different distributions of intermetallics (IMPs) in aluminum substrates was studied. Surface characterisations evidenced similar morphology and chemical composition of the sealed layers on both substrates. Electrochemistry and time-lapse microscopy demonstrated the layer’s stability under anodic polarization and its localized pitting under cathodic polarization in NaCl electrolyte. No chemical or morphological modifications were detected outside of the pits. The number and size of the pits depended on the IMPs distribution in the alloy, buried under 6 µm thick oxide. A degradation mechanism explaining these observations was proposed.
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