Abstract
P. Bruno,1 J. Kudrnovský,2,3 V. Drchal,2,3 and I. Turek4 1Institut d’Electronique Fondamentale, CNRS URA 22, Bâtiment 220, Universite Paris-Sud, F-91405 Orsay, France 2Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, CZ-180 40 Praha 8, Czech Republic 3Institute for Technical Electrochemistry, Technical University of Vienna, Getreidemarkt 9, A-1060 Vienna, Austria 4Institute of Physics of Materials, Academy of Sciences of the Czech Republic, Žižkova 22, CZ-616 62 Brno, Czech Republic (Received 6 February 1996)
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