Interferometric Scattering Microscopy with Polarization-Selective Dual Detection Scheme: Capturing the Orientational Information of Anisotropic Nanometric Objects

Abstract

Single-particle tracking is a powerful technique to reveal an underlying principle of microscopic phenomena. Here we report an optical microscopy technique, polarization-selective interferometric scattering microscopy, that enables us to capture rotational as well as positional information on nanoscale objects. This technique grants all the merits of interferometric scattering microscopy and provides a further advantage of the capability of determining the orientation of single nanoscopic objects in a straightforward and facile way. We anticipate that this technique would be of critical use in rotational tracking of a single anisotropic particle or biological system in the nanoscopic world.