Abstract
A simple and direct interferometric technique for characterization of the source size and the transverse coherence length of synchrotron hard X-rays is discussed. A high level of spatial coherence of the X-ray beam allows us to detect the diffraction images (phase contrast patterns) of both the boron fiber of about 100 μm diameter and the slit of different widths. We characterize the level of coherence by comparison of the measured visibility of the interference fringes with the theoretical values by means of simple analytical formulas derived in this work. The analytical theory of both the fiber and the slit diffraction images is discussed in details. The results obtained analytically are confirmed by computer simulations. The proposed technique is well suited for third-generation synchrotron sources and was applied at the European Synchrotron Radiation Facility.
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