Year-end Sale % OFF 
Abstract
Interference between radiative and dielectronic recombination in electron and highly charged Bi ion collisions has been studied by observing emitted x-rays with the Tokyo electron beam ion trap. The so-called Fano line shapes were fitted to the KLL DR resonant profiles observed as the enhancement of the x-ray counts. The shape parameters q have been determined similarly to the previous experiments for highly charged U [D A Knapp et al 1995 Phys. Rev. Lett. 74 54] and Hg ions [A J Gonzalez Martinez et al 2005 Phys. Rev. Lett. 94 20320]. The present results were compared to the previous results.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
