Abstract
Nb/MgO/Nb/Al2O3 superlattices were prepared by MBE growth of Nb and MgO films on a (012)Al2O3 sapphire substrate. Cross sectional HREM specimens were prepared using standard techniques involving mechanical grinding to a thickness of 0.13 mm, dimpling to a thickness of 20 μm and ion beam milling at 6 kV. The samples were subsequently examined in a top-entry JEOL 4000EX high resolution electron microscope with a point-to-point resolution of ∼0.19 nm. Image simulations were performed using the SHRLI programs developed by O'Keefe.
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Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
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